WTS-311NX
- High-end CCD/CIS Test System
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The WTS-311NX is based on WTS-311. We added logic test functions to the system and strengthened the functions such as test frequency, pixcel data acquisition , parallel testing function, high-speed data transfer, image processing and so on.
Product Specification
| Device to test | High-end CCD, CMOS image sensor |
| Parallel Testing | MAX 4 devices |
| Digital I/O | 200MHz, MAX 256PIN |
| Drive Voltage | -1.5V to +6.5V |
| PerPin Source and Meter | ±60V/±250mA 24ch, ±60V/±25mA 24ch |
| Image Data Capture | Analog 80MHz, Digital 200MHz MAX 16ch, 384M pixel data/ch |
| Serial Image Data Capture | Available for custom LVDS protocol, 1Gbps(Max 2.3Gbps)/Lane, x64Lanes |