menu

Line-up for Test Systems

WTS-311NX

High-end CCD/CIS Test System

The WTS-311NX is based on WTS-311. We added logic test functions to the system and strengthened the functions such as test frequency, pixcel data acquisition , parallel testing function, high-speed data transfer, image processing and so on.

Product Specification

Device to test

High-end CCD, CMOS image sensor

Parallel Testing

MAX 4 devices

Digital I/O

200MHz, MAX 256PIN

Drive Voltage

-1.5V to +6.5V

PerPin Source
and Meter

±60V/±250mA 24ch, ±60V/±25mA 24ch

Image Data
Capture

Analog 80MHz, Digital 200MHz MAX 16ch, 384M pixel data/ch

Serial Image
Data Capture

Available for custom LVDS protocol, 1Gbps(Max 2.3Gbps)/Lane, x64Lanes