Line-up for Test Systems

We developed new LCD Driver ATE system which made “WTS-577SR” based on [WTS-577] that design completed new system with major improvements to current system, and run as C# which mean keeping user friendly system environment too. And it achieved extremely fast data processing speed and high-speed test too.

The new system able to process big data at high speed such as maximum drive frequency about 2Gbps and the maximum data transfer rate is 11Gbps. Such a new technology able to big quantity data process requirements of the Five-Generation(5G) that is latest standard, and it is the answer for the test on standard interface with smartphone as MIPI, or mini-LVDS that is also standard interface of LCD and OLED panel. And new system will be supporting any driver-IC test that including P2P function too.

In addition, the new system provides 512 pins of I/O channel and 2304 pins of LCD channel that dedicate test to multiple devices and/or high-resolution full HD driver IC too.