Wintest Corp.
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Organic EL / LCOS array / CCD / CMOS imagesensor Inspection equipment
WTS-311NX
WTS-311
Digital output CIS Inspection equipment
WTS-377
WTS-347
  Analog mixed-signal IC Inspection equipment
WTS-750/800
WTS-700
LCD/PDP/organic EL driver IC inspection equipment
WTS-577
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WTS-311 Analog and Mixed Signal IC Test System

About the product [ ContactContact]
WTS-311 The WTS-700 Analog and Mixed Signal Tester offers semiconductor manufacturers a next-generation test platform that significantly accelerates DUT throughput at less than half the cost of conventional test systems. Compact and highly scalable, the WTS-700's advanced design makes test platform implementation and test set-up quick and easy. Industry-leading throughput results from the WTS-700's multi-site, multistation capabilities allowing you to test multiple devices in parallel across a two-station four-site system. Integrated under the advanced, user-friendly ProteusTM software environment, users easily configure their WTS-700 systems for standard and specialized testing across a wide range of analog and mixed signal devices.
Device to test : Precision OP-AMP, Motor Driver, Telecom Device, Sensors(GPS, G-sensor etc.), AC/DC Power Controll IC, Analog/Digital Audio etc.
Mainframe :

Small, scalable & modular design
Zero footprint overhead probing
State-of-the-art hardware
High density Instrument options
Multi-Site
Multi-Station

System Software :

Multi-site/station software
Windows XP platform
VB.Net Programming Environment
Multi Language Supprort
Multi-client server
GUI Interface
System calibration/checkers
Datalogging and statistics

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