Wintest Corp.
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Organic EL / LCOS array / CCD / CMOS imagesensor Inspection equipment
WTS-311NX
WTS-311
Digital output CIS Inspection equipment
WTS-377
WTS-347
  Analog mixed-signal IC Inspection equipment
WTS-750/800
WTS-700
LCD/PDP/organic EL driver IC inspection equipment
WTS-577
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WTS-311 Digital output CIS Test System

About the product [ ContactContact]
WTS-311 WTS-347 is the industry's firtst card type digital output CMOS image sensor test system. The feature is low price, compact and low power consumption. One test card with the combining of DC, Logic, Image Processing test funcions does test one device. (MAX 4 test cards in one test system). It can support R&D single site, up to 8 site mass production. It is easy to switch from R&D single site mode to multiple site mass production mode by only one click.
Device to test : Digital output CMOS Image Sensor
Parallel Testing :

1 to 4 devices. (MAX 8 devices if put 2 system together.)

Digital IO :

48PIN/Test Card x 4

Test Rate :

MAX 80MHz

Device Power Supply :

4CH/Test Card x 4

Image Data Capture :

100MHz, MAX 190M Pixel/Test Card.

2 Card Mode :

To test a large number of device by assigning 2 test card into 1 DUT.

System Software :

GUI debug tool: Only using GUI to drive device, adjust voltage, timing, and do image processing.
Easy to generate patterns by GUI pattern editor.
Easy to make test program by using C# language.

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