Wintest Corp.
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Organic EL / LCOS array / CCD / CMOS imagesensor Inspection equipment
WTS-311NX
WTS-311
Digital output CIS Inspection equipment
WTS-377
WTS-347
  Analog mixed-signal IC Inspection equipment
WTS-750/800
WTS-700
LCD/PDP/organic EL driver IC inspection equipment
WTS-577
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WTS-311NX High-end CCD/CIS Test System

About the product [ ContactContact]
WTS-311 The WTS-311NX is based on WTS-311. We added logic test functions to the system and strengthened the functions such as test frequency, pixcel data acquisition , parallel testing function, high-speed data transfer, image processing and so on.
Device to test : High-end CCD, CMOS image sensor
Parallel Testing :

MAX 4 devices

Digital I/O :

200MHz, MAX 256PIN

Drive Voltage :

-1.5V to +6.5V

PerPin Source and Meter :

±60V/±250mA 24ch, ±60V/±25mA 24ch

Image Data Capture :

Analog 80MHz, Digital 200MHz MAX 16ch, 384M pixel data/ch

Serial Image Data Capture :

Available for custom LVDS protocol, 1Gbps(Max 2.3Gbps)/Lane, x64Lanes

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