menu

Line-up for Test Systems

WTS-311

LCD/OLED/LCOS Array/CCD/CIS Test System

The latest Full Spec Test System for OLED, LCD, LCOS, CCD, CMOS Image Sensor (CIS). We strengthened the function vastly, such as testing frequency, parallel testing function, pixcel data acquisition and so on, to meet the testing requirement for the device trend in the future.

Product Specification

Device to test OLED, LCD, LCOS, CCD, CIS, LCD VGA - UXGA
( Full pins or Block Probing )
Measurement
Form
CDS, DCS Available: Digital Integration
Treatment
Form
By the Image Processing. 4 times faster than ever
Drive Pattern
and Frequency
DC to 80MHz
Drive Voltage -10.24v - +20.47v
Acquisition Max 8ch(covers 16 devices in max), 380M pixel data/ch
DC Parametric
Test
Pin Continuity Test, Shift Resister Test,
Per Pin Voltage Margin Test, Leakage Test, etc.